Scanning Electron Microscopy

SEM-EDS: High-Resolution Imaging & Elemental Analysis

Scanning Electron Microscopy with Energy Dispersive Spectroscopy (SEM-EDS) is a powerful analytical technique used to examine the surface morphology, microstructure, and elemental composition of materials at high magnifications. By combining the high-resolution imaging of SEM with the chemical analysis capabilities of EDS, this technique enables detailed characterization of a wide range of materials, making it an essential tool for research, quality control, and failure analysis.

SEM provides sharp, high-magnification images, revealing structural details at the micron and nanometer scales, while EDS detects and maps the elemental composition of the sample, providing crucial insights into material properties.