Webinar on Effective data analysis countering outlier effect by Mr. Basudev Bhattacharya
12-Nov-2025
Data is analyzed for checking manufacturing process capability (Cp Cpk) and for controlling both the manufacturing and the measurement processes using Control Charts with 2 sigma & 3 sigma control limits.
For this, Average & Sample Standard Deviation of the data are estimated, which are subsequently used for calculating process capability & control parameters. However, when there are outliers in the data, both the average and the sample standard deviation get affected, resulting in unreliable values of the quality parameters leading to unreliable decisions.
This webinar aims to provide a simple solution as to how the effect of outliers can be nullified so that the result of the analyzed data and the subsequent decision is reliable.
Basudev Bhattacharya has been working in the field of Quality and Measurement for more than 53 years, is a Graduate Electrical Engineer from IIT-Bombay, holds a Diploma in Material Management from Punjabi University-Patiala, is a Certified Lead Auditor for ISO 9001 QMS and Laboratory Accreditation as per ISO/IEC 17025
He has been an International Consultant of International Trade Centre (ITC) of UNCTAD/WTO and United Nation Industrial Development Organization (UNIDO) on laboratory accreditation, measurement, and quality control. He was the Senior Laboratory Accreditation Expert of the BSI Group, UK., and Principal Consultant of Federation of Indian Chambers of Commerce & Industry (FICCI).
He has been training industry and laboratory personnel in India and other countries (Bangladesh, Mauritius, Kuwait, Dubai, Abu Dhabi, Rwanda, Maldives, Bhutan, Nepal, Seychelles, Laos) on quality & measurement related topics, and has trained more than 3600 persons through more than 360 training programmes
More about his activities is available in his website www.systems-training.in